INTERNATIONAL PATENT: DIC CORPORATION, ＤＩＣ株式会社 FILES APPLICATION FOR "TEST MODULE AND TEST DEVICE"

GENEVA, May 11 -- DIC CORPORATION (35-58, Sakashita 3-chome, Itabashi-ku Tokyo1748520), ＤＩＣ株式会社 (東京都板橋区坂下三丁目３５番５８号) filed a patent application (PCT/JP2025/021399) for "TEST MODULE AND TEST DEVICE" on Jun 12, 2025. With publication no. WO/2026/094317, the details related to the patent application was published on May 07, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): ICHIKAWA Atsushi (c/o DIC Corporation, 7-20, Nihonbashi 3-ch...