International Patent: DEVICE TO DETECT DEFECTS IN HARD-SHELLED OBJECTS (EGGS) AND METHOD THEREOF

GENEVA, July 18 -- GUGNANI, Rati filed a patent application (IB2026/050084) for “DEVICE TO DETECT DEFECTS IN HARD-SHELLED OBJECTS (EGGS) AND METHOD THEREOF”. With publication no. WO/2026/150300, here are the other details related to the patent application:

Kind: Initial Publication with ISR [A1]

IPC: G06T 7/00

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

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