GENEVA, July 18 -- GAGGL, Rainer filed a patent application (EP2025/074280) for “DEVICE FOR TESTING SEMICONDUCTOR ELEMENTS”. With publication no. WO/2026/149665, here are the other details related to the patent application:
Kind: Initial Publication with ISR [A1]
IPC: G01R 31/28
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
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