International Patent: DEVICE FOR MAGNETICALLY DETECTING AT LEAST ONE DEFECT IN A METAL REINFORCING ELEMENT AND ASSOCIATED METHOD

GENEVA, July 2 -- COMPAGNIE GENERALE DES ETABLISSEMENTS MICHELIN filed a patent application (FR2025/051066) for “DEVICE FOR MAGNETICALLY DETECTING AT LEAST ONE DEFECT IN A METAL REINFORCING ELEMENT AND ASSOCIATED METHOD”. With publication no. WO/2026/132699, here are the other details related to the patent application:

Kind: Initial Publication with ISR [A1]

IPC: B60C 9/00

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

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