GENEVA, July 2 -- RAZER (ASIA-PACIFIC) PTE. LTD. filed a patent application (SG2025/050556) for “DEVICE AND METHOD FOR AUTOMATED DEFECT DETECTION”. With publication no. WO/2026/135559, here are the other details related to the patent application:

Kind: Initial Publication with ISR [A1]

IPC: A63F 13/60

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

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