GENEVA, Oct. 15 -- CINDERGLOW TECHNOLOGIES LLC filed a patent application (US2026/022638) for “COMPUTERIZED METROLOGY FOR MEASURING SHAPED OBJECTS”. With publication no. WO/2026/217542, here are the other details related to the patent application:
Kind: Initial Publication with ISR [A1]
IPC: G06T 7/00
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
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