INTERNATIONAL PATENT: APPLIED MATERIALS, INC. FILES APPLICATION FOR "SUBSTRATE DEFECT TROUBLESHOOTING ANALYSIS USING MACHINE LEARNING"

GENEVA, April 14 -- APPLIED MATERIALS, INC. (3050 Bowers AvenueSanta Clara, CA 95054) filed a patent application (PCT/US2025/047250) for "SUBSTRATE DEFECT TROUBLESHOOTING ANALYSIS USING MACHINE LEARNING" on Sep 19, 2025. With publication no. WO/2026/075834, the details related to the patent application was published on Apr 09, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): COLLINS, Jeffrey, Ryan (3050 Bowers AvenueSanta Clara, CA 95054), WANG, Hexuan (3050 Bowers AvenueSanta Clara, CA 95054), KUMAR, Abhinav (3050 Bowers AvenueSanta Clara, CA 95054), KUMAR, Bhaskar (3050 Bowers AvenueSanta C...