INTERNATIONAL PATENT: APPLIED MATERIALS, INC. FILES APPLICATION FOR "METHOD OF FORMING SI/SIGE SUPERLATTICE STRUCTURES USING XRF MEASUREMENTS AND PROCESS CONTROL TECHNIQUES"

GENEVA, March 19 -- APPLIED MATERIALS, INC. (3050 Bowers AvenueSanta Clara, California 95054) filed a patent application (PCT/US2025/044739) for "METHOD OF FORMING SI/SIGE SUPERLATTICE STRUCTURES USING XRF MEASUREMENTS AND PROCESS CONTROL TECHNIQUES" on Sep 03, 2025. With publication no. WO/2026/055269, the details related to the patent application was published on Mar 12, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): LIU, Biao (5015 Elmwood DriveSan Jose, California 95130), PAN, Cheng (c/o Applied Materials, Inc., Law Dept., M/S 12693050 Bowers AvenueSanta Clara, California 95054), CAI, M...