INTERNATIONAL PATENT: APPLIED MATERIALS, INC. FILES APPLICATION FOR "ARTIFICIAL INTELLIGENCE-BASED BIAS PREDICTION FOR RUN-TO-RUN PROCESS CONTROL"

GENEVA, May 6 -- APPLIED MATERIALS, INC. (3050 Bowers AvenueSanta Clara, California 95054) filed a patent application (PCT/US2025/051724) for "ARTIFICIAL INTELLIGENCE-BASED BIAS PREDICTION FOR RUN-TO-RUN PROCESS CONTROL" on Oct 20, 2025. With publication no. WO/2026/090083, the details related to the patent application was published on Apr 30, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): CHEN, Yi-Chieh (3050 Bowers AvenueSanta Clara, California 95054)

Abstract: Methods and systems for artificial intelligence (AI)-based bias prediction for run-to-run (R2R) process control are provided. A ...