INTERNATIONAL PATENT: APPLIED MATERIALS, INC., KHAMEHGIR, PEJMAN, FRANKE, SEBASTIAN FILES APPLICATION FOR "MEASUREMENT SYSTEM FOR DETERMINING A THICKNESS OF A LAYER TO BE DEPOSITED ON A SUBSTRATE PLANE OF A SUBSTRATE, DEPOSITION APPARATUS AND METHOD OF DETERMINING A THICKNESS OF A LAYER"

GENEVA, March 23 -- APPLIED MATERIALS, INC. (3050 Bowers AvenueSanta Clara, California 95054), KHAMEHGIR, Pejman (Luisenthaler Strasse 1661184 Karben), FRANKE, Sebastian (Else-Lasker-Schuler-Weg 463457 Hanau) filed a patent application (PCT/IB2024/058780) for "MEASUREMENT SYSTEM FOR DETERMINING A THICKNESS OF A LAYER TO BE DEPOSITED ON A SUBSTRATE PLANE OF A SUBSTRATE, DEPOSITION APPARATUS, AND METHOD OF DETERMINING A THICKNESS OF A LAYER" on Sep 10, 2024. With publication no. WO/2026/058021, the details related to the patent application was published on Mar 19, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WI...