INTERNATIONAL PATENT: APPLIED MATERIALS, INC., ERICKSON, DAVID FILES APPLICATION FOR "UTILIZING ELECTROCHEMICAL ANALYTICAL METHODS TO MEASURE PLATING BATH BREAKDOWN PRODUCTS SUCH AS MPSA TO DETECT CHEMISTRY PROBLEMS PRIOR TO HAVING ON IMPACT ON WAFER LEVEL PROCESS PERFORMANCE"

GENEVA, March 3 -- APPLIED MATERIALS, INC. (3050 Bowers AvenueSanta Clara, California 95054-3299), ERICKSON, David (3050 Bowers AvenueSanta Clara, California 95054-3299) filed a patent application (PCT/US2024/043562) for "UTILIZING ELECTROCHEMICAL ANALYTICAL METHODS TO MEASURE PLATING BATH BREAKDOWN PRODUCTS SUCH AS MPSA TO DETECT CHEMISTRY PROBLEMS PRIOR TO HAVING ON IMPACT ON WAFER LEVEL PROCESS PERFORMANCE" on Aug 23, 2024. With publication no. WO/2026/043494, the details related to the patent application was published on Feb 26, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): APPLIED MAT...