INTERNATIONAL PATENT: AMLOGIC (HEFEI) CO., LTD., 合肥晶晨芯半导体有限公司 FILES APPLICATION FOR "METHOD AND APPARATUS FOR EXTRACTING CONTOUR FEATURE AND ELECTRONIC DEVICE, MEDIUM AND PROGRAM PRODUCT"

GENEVA, March 8 -- AMLOGIC (HEFEI) CO., LTD. (Room 704, Tuoji Gold Block C, No. 689 Changjiang West Road, High-tech DistrictHefei, Anhui 230071), 合肥晶晨芯半导体有限公司 (中国安徽省合肥市高新区长江西路689号拓基金座C704) filed a patent application (PCT/CN2024/114439) for "METHOD AND APPARATUS FOR EXTRACTING CONTOUR FEATURE, AND ELECTRONIC DEVICE, MEDIUM AND PROGRAM PRODUCT" on Aug 26, 2024. With publication no. WO/2026/044442, the details related to the patent application was published on Mar 05, 2026.

Notably, the patent application was submitted und...