GENEVA, March 23 -- ALTROVE TECH (25 rue de Ponthieu75008 Paris) filed a patent application (PCT/EP2025/075610) for "SYSTEMS AND METHODS FOR MATERIALS CHARACTERISATION" on Sep 09, 2025. With publication no. WO/2026/057556, the details related to the patent application was published on Mar 19, 2026.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
Inventor(s): LAULAINEN, Joonatan (c/o ALTROVE TECH25 rue de Ponthieu75008 Paris)
Abstract: A computer implemented method of characterising a crystalline material is disclosed. The method includes obtaining diffraction data and a predicted phase distribution from a cry...