INTERNATIONAL PATENT: ALCON INC. FILES APPLICATION FOR "MONITORING THE BRIGHTNESS OF A LIGHT SOURCE OF A LIGHT SYSTEM"

GENEVA, March 2 -- ALCON INC. (Rue Louis-d'Affry 61701 Fribourg) filed a patent application (PCT/IB2025/058159) for "MONITORING THE BRIGHTNESS OF A LIGHT SOURCE OF A LIGHT SYSTEM" on Aug 11, 2025. With publication no. WO/2026/041960, the details related to the patent application was published on Feb 26, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): KONZ, Annelene (c/o WaveLight GmbHAm Wolfsmantel 590158 Erlangen), HURICH, Joerg Michael (c/o WaveLight GmbHAm Wolfsmantel 591058 Erlangen)

Abstract: In certain embodiments, an ophthalmic system includes a light system, an imaging system, and a...