INTERNATIONAL PATENT: ADVANCED MICROTESTING INC. FILES APPLICATION FOR "TESTING SYSTEM, SOURCE MEASURE UNIT THEREFOR AND ASSOCIATED METHOD OF TESTING A DEVICE UNDER TEST"

GENEVA, April 13 -- ADVANCED MICROTESTING INC. (101 Rue Saint-Jean-BoscoBureau A-1330Gatineau, Quebec J8Y 3G5) filed a patent application (PCT/CA2025/051281) for "TESTING SYSTEM, SOURCE MEASURE UNIT THEREFOR, AND ASSOCIATED METHOD OF TESTING A DEVICE UNDER TEST" on Sep 29, 2025. With publication no. WO/2026/073339, the details related to the patent application was published on Apr 09, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): DUFOUR, Patrick (201-455 boul. GappeGatineau, Quebec J8T 0G1)

Abstract: The testing system can have a controller, and a plurality of channels which may have sour...