International Patent: ABNORMALITY DETECTION SYSTEM, ABNORMALITY DETECTION METHOD, AND ABNORMALITY DETECTION PROGRAM

GENEVA, Nov. 6 -- AKARI INC. filed a patent application (JP2026/014332) for “ABNORMALITY DETECTION SYSTEM, ABNORMALITY DETECTION METHOD, AND ABNORMALITY DETECTION PROGRAM”. With publication no. WO/2026/230291, here are the other details related to the patent application:

Kind: Initial Publication with ISR [A1]

IPC: G08G 1/00

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

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