US Patent Issued to CNH Industrial America on July 7 for "Agricultural baler with flake prediction for bale length control" (Canadian, American Inventors)

ALEXANDRIA, Va., July 7 -- United States Patent no. 12,674,654, issued on July 7, was assigned to CNH Industrial America LLC (New Holland, Pa.). "Agricultural baler with flake prediction for bale len... और पढ़ें

US Patent Issued to APPLIED Materials on July 7 for "Inductive sensor interface for on-wafer plating thickness measurements" (Montana Inventor)

ALEXANDRIA, Va., July 7 -- United States Patent no. 12,674,655, issued on July 7, was assigned to APPLIED Materials Inc. (Santa Clara, Calif.). "Inductive sensor interface for on-wafer plating thickn... और पढ़ें

US Patent Issued to VAMAG on July 7 for "System for checking the attitude angles of the wheels of a land vehicle, in particular for a contactless check, and associated method of checking" (Italian Inventors)

ALEXANDRIA, Va., July 7 -- United States Patent no. 12,674,656, issued on July 7, was assigned to VAMAG S.r.l. (Cassano Magnago, Italy). "System for checking the attitude angles of the wheels of a la... और पढ़ें

US Patent Issued to Hamamatsu Photonics, Energetiq Technology on July 7 for "Optical coherence tomography system for subsurface inspection" (Massachusetts Inventors)

ALEXANDRIA, Va., July 7 -- United States Patent no. 12,674,657, issued on July 7, was assigned to Hamamatsu Photonics K.K. (Shizuoka, Japan) and Energetiq Technology Inc. (Wilmington, Mass.). "Optica... और पढ़ें

US Patent Issued to Quality Vision International on July 7 for "Partial coherence mitigation in video measurement systems via illumination apodization" (New York Inventor)

ALEXANDRIA, Va., July 7 -- United States Patent no. 12,674,658, issued on July 7, was assigned to Quality Vision International Inc. (Rochester, N.Y.). "Partial coherence mitigation in video measureme... और पढ़ें

US Patent Issued to FANUC on July 7 for "Three-dimensional measurement system" (Japanese Inventor)

ALEXANDRIA, Va., July 7 -- United States Patent no. 12,674,659, issued on July 7, was assigned to FANUC Corp. (Yamanashi, Japan). "Three-dimensional measurement system" was invented by Wataru Tooyama... और पढ़ें

US Patent Issued to GUANGDONG UNIVERSITY OF TECHNOLOGY on July 7 for "Three-dimensional measurement method and apparatus for structured light system based on system pose optimization" (Chinese Inventors)

ALEXANDRIA, Va., July 7 -- United States Patent no. 12,674,660, issued on July 7, was assigned to GUANGDONG UNIVERSITY OF TECHNOLOGY (Guangzhou, China). "Three-dimensional measurement method and appa... और पढ़ें

US Patent Issued to GOERTEK on July 7 for "Method and apparatus for controlling an electronic device, device and readable storage medium" (Chinese Inventor)

ALEXANDRIA, Va., July 7 -- United States Patent no. 12,674,661, issued on July 7, was assigned to GOERTEK INC. (Shandong, China). "Method and apparatus for controlling an electronic device, device an... और पढ़ें

US Patent Issued to KLA Coporation on July 7 for "System and method for acquiring alignment measurements of structures of a bonded sample" (American, German, Israeli Inventors)

ALEXANDRIA, Va., July 7 -- United States Patent no. 12,674,662, issued on July 7, was assigned to KLA Coporation (Milpitas, Calif.). "System and method for acquiring alignment measurements of structu... और पढ़ें

US Patent Issued to Carl Zeiss GOM Metrology on July 7 for "Method and device for a photogrammetric measurement" (German Inventors)

ALEXANDRIA, Va., July 7 -- United States Patent no. 12,674,664, issued on July 7, was assigned to Carl Zeiss GOM Metrology GmbH (Braunschweig, Germany). "Method and device for a photogrammetric measu... और पढ़ें

• ««
• «
• 3582
• 3583
• 3584
• 3585
• 3586
• 3587
• 3588
• 3589
• 3590
• 3591
• »
• »»