US Patent Issued to University of Central Florida Research Foundation on April 14 for "Methods of artificial intelligence-assisted infrastructure assessment using mixed reality systems" (Florida Inventors)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,602,764, issued on April 14, was assigned to University of Central Florida Research Foundation Inc. (Orlando, Fla.). "Methods of artificial in... Read More

US Patent Issued to Meinan Machinery Works on April 14 for "Defect inspection system and defect inspection method" (Japanese Inventors)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,602,765, issued on April 14, was assigned to Meinan Machinery Works Inc. (Aichi, Japan). "Defect inspection system and defect inspection metho... Read More

US Patent Issued to CONTEMPORARY AMPEREX TECHNOLOGY (HONG KONG) on April 14 for "Method, apparatus, device, medium and product for detecting alignment of battery electrode plates" (Chinese Inventors)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,602,766, issued on April 14, was assigned to CONTEMPORARY AMPEREX TECHNOLOGY (HONG KONG) Ltd. (Hong Kong). "Method, apparatus, device, medium ... Read More

US Patent Issued to University of South Florida on April 14 for "System of and method for analyzing thoroughfare conditions via oil spot analysis" (Florida Inventors)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,602,767, issued on April 14, was assigned to University of South Florida (Tampa, Fla.). "System of and method for analyzing thoroughfare condi... Read More

US Patent Issued to OPT MACHINE VISION TECH on April 14 for "Surface defect detection model training method, and surface defect detection method and system" (Chinese Inventors)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,602,768, issued on April 14, was assigned to OPT MACHINE VISION TECH Co. LTD. (Dongguan, China). "Surface defect detection model training meth... Read More

US Patent Issued to Ford Global Technologies on April 14 for "Systems and methods for detecting vehicle defects" (Michigan Inventors)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,602,769, issued on April 14, was assigned to Ford Global Technologies LLC (Dearborn, Mich.). "Systems and methods for detecting vehicle defect... Read More

US Patent Issued to Dell Products on April 14 for "Information handling system visual image inspection to support hinge reuse and recycling" (American, Taiwanese Inventors)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,602,770, issued on April 14, was assigned to Dell Products LP (Round Rock, Texas). "Information handling system visual image inspection to sup... Read More

US Patent Issued to Applied Materials on April 14 for "In situ wafer seal chuck defects identification" (Indian, American Inventors)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,602,771, issued on April 14, was assigned to Applied Materials Inc.. "In situ wafer seal chuck defects identification" was invented by Gangadh... Read More

US Patent Issued to Progenics Pharmaceuticals, EXINI Diagnostics on April 14 for "Systems and methods for rapid neural network-based image segmentation and radiopharmaceutical uptake determination" (Swedish, American Inventors)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,602,772, issued on April 14, was assigned to Progenics Pharmaceuticals Inc. (N. Billerica, Mass.) and EXINI Diagnostics AB (Lund, Sweden). "Sy... Read More

US Patent Issued to Washington University on April 14 for "Deep-learning-based T1-enhanced selection of linear coefficients (DL-TESLA) for PET/MR attenuation correction" (Missouri Inventors)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,602,773, issued on April 14, was assigned to Washington University (St. Louis). "Deep-learning-based T1-enhanced selection of linear coefficie... Read More

• ««
• «
• 14481
• 14482
• 14483
• 14484
• 14485
• 14486
• 14487
• 14488
• 14489
• 14490
• »
• »»