US Patent Issued to Meinan Machinery Works on April 14 for "Defect inspection system and defect inspection method" (Japanese Inventors)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,602,765, issued on April 14, was assigned to Meinan Machinery Works Inc. (Aichi, Japan).

"Defect inspection system and defect inspection method" was invented by Masamichi Iwamoto (Aichi, Japan), Takehiko Tokuyama (Aichi, Japan), Keijiro Yamaguchi (Aichi, Japan) and Masato Miura (Aichi, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "Images of a face surface and a back surface of a plywood 10 that is conveyed on belt conveyors 5U and 5D are captured by imaging devices of first illumination and imaging units 1F and 1B to generate depth information, a shape of the plywood 10 is measured by shape measurement units 3F and 3B, which are provided at loca...