US Patent Issued to Colorado School of Mines on May 12 for "Optical concentrate monitoring for membrane scaling mitigation" (Colorado Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,063, issued on May 12, was assigned to Colorado School of Mines (Golden, Colo.). "Optical concentrate monitoring for membrane scaling mitiga... Read More

US Patent Issued to KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE on May 12 for "Split prism silicon-based liquid immersion microchannel measuring device and method" (South Korean Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,064, issued on May 12, was assigned to KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE (Daejeon, South Korea). "Split prism silicon-based ... Read More

US Patent Issued to Truvian Sciences on May 12 for "Systems and methods for multianalyte detection" (California Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,065, issued on May 12, was assigned to Truvian Sciences Inc. (San Diego). "Systems and methods for multianalyte detection" was invented by D... Read More

US Patent Issued to Uster Technologies on May 12 for "Detecting a mixture ratio of two components of a textile fiber structure" (Swiss Inventor)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,066, issued on May 12, was assigned to Uster Technologies AG (Uster, Switzerland). "Detecting a mixture ratio of two components of a textile... Read More

US Patent Issued to University of Central Florida Research Foundation on May 12 for "Spectrometer with rotated volume Bragg grating" (Florida Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,067, issued on May 12, was assigned to University of Central Florida Research Foundation Inc. (Orlando, Fla.). "Spectrometer with rotated vo... Read More

US Patent Issued to SEIKO EPSON on May 12 for "Optical device, spectroscopic device, and spectroscopic method" (Japanese Inventor)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,068, issued on May 12, was assigned to SEIKO EPSON Corp. (Japan). "Optical device, spectroscopic device, and spectroscopic method" was inven... Read More

US Patent Issued to Konica Minolta on May 12 for "Gas concentration measuring device, gas concentration measuring method, and program" (Japanese Inventor)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,069, issued on May 12, was assigned to Konica Minolta Inc. (Tokyo). "Gas concentration measuring device, gas concentration measuring method,... Read More

US Patent Issued on May 12 for "Method for quality inspection of etching paste material based on spectral response difference" (Chinese Inventor)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,070, issued on May 12. "Method for quality inspection of etching paste material based on spectral response difference" was invented by Zijin... Read More

US Patent Issued to ADVANTEST on May 12 for "Electromagnetic wave measuring apparatus, method, and recording medium" (Japanese Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,071, issued on May 12, was assigned to ADVANTEST Corp. (Tokyo). "Electromagnetic wave measuring apparatus, method, and recording medium" was... Read More

US Patent Issued to DAIKIN INDUSTRIES on May 12 for "Method for inspecting shaped product, and method for manufacturing shaped product" (Japanese Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,072, issued on May 12, was assigned to DAIKIN INDUSTRIES LTD. (Osaka, Japan). "Method for inspecting shaped product, and method for manufact... Read More

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