US Patent Issued on May 12 for "Method for quality inspection of etching paste material based on spectral response difference" (Chinese Inventor)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,070, issued on May 12.

"Method for quality inspection of etching paste material based on spectral response difference" was invented by Zijing Xu (Suzhou, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for quality inspection of an etching paste material based on a spectral response difference, including: identifying a position of density mutation boundary through spectral collection and density gradient analysis. Applying a specific frequency beam to obtain the resonance response parameter, generating stress field reconstruction data. Performing a reverse optical tracking to obtain a defect formation path, generating degradation predict...