E-HENG SHANGHAI IMP. & EXP. secures contract for Procurement of 0626-234230110058/01 High resolution cold field emission scanning electron microscope system(2)

Posted On: 2026-03-04

China, March 4 -- China based E-HENG SHANGHAI IMP. & EXP. has secured contract from Suzhou Xiangcheng Industrial Technology Research Institute for Procurement of 0626-234230110058/01 High resolution cold field emission scanning electron microscope system(2). The value of the contract is not disclosed.

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E-HENG SHANGHAI IMP. & EXP. secures contract for Procurement of 0626-234230110058/01 High resolution cold field emission scanning electron microscope system(2)