Manila, April 29 -- The Department of Science and Technology (DOST) on Wednesday said it recently acquired an equipment capable of analyzing materials and can also detect defects at a nanoscale level.

The new equipment, field emission scanning electron microscope (FE-SEM), is housed at the Advanced Device and Materials Testing Laboratory (ADMATEL) inside the DOST Compound in Bicutan, Taguig.

It will be used with the energy dispersive X-ray and electron backscatter diffraction analyzer to expand ADMATEL's capabilities in failure analysis and material characterization.

According to the DOST, the FE-SEM will help companies improve product quality and reduce delays in the production of electronic devices like smartphones and laptops.

"Inv...