Japan, Aug. 14 -- NANOSEEX INC has got intellectual property rights for 'X-RAY REFLECTION ANALYSIS SYSTEM APPLYING MULTIPLE X-RAY BEAMS.' Other related details are as follows:

Application Number: JP,2025-038367

Category (FI): G21K1/06@B,G01N23/20008,G01N23/207,G01N23/201,G01N23/223,G01N23/20,400,G01B15/00@Z,G21K1/00@X,G01T1/24

Stage: Grant (IP right granted following substantive examination.)

Filing Date: March 11, 2025

Publication Date: Nov. 7, 2025

The original document can be viewed at: https://www.j-platpat.inpit.go.jp/p0100

Disclaimer: Curated by HT Syndication....