Japan, Sept. 3 -- NACHI FUJIKOSHI CORP has got intellectual property rights for 'X-RAY MEASUREMENT DEVICE.' Other related details are as follows:
Application Number: JP,2022-186195
Category (FI): G01N23/20008,G01N23/20
Stage: Grant (IP right granted following substantive examination.)
Filing Date: Nov. 22, 2022
Publication Date: June 3, 2024
The original document can be viewed at: https://www.j-platpat.inpit.go.jp/p0100
Disclaimer: Curated by HT Syndication....