Japan, Sept. 3 -- NACHI FUJIKOSHI CORP has got intellectual property rights for 'X-RAY MEASUREMENT DEVICE.' Other related details are as follows:

Application Number: JP,2022-186195

Category (FI): G01N23/20008,G01N23/20

Stage: Grant (IP right granted following substantive examination.)

Filing Date: Nov. 22, 2022

Publication Date: June 3, 2024

The original document can be viewed at: https://www.j-platpat.inpit.go.jp/p0100

Disclaimer: Curated by HT Syndication....