Japan, April 22 -- OMRON CORP has got intellectual property rights for 'X-RAY INSPECTION METHOD USING X-RAY INSPECTION APPARATUS AND X-RAY INSPECTION APPARATUS.' Other related details are as follows:
Application Number: JP,2022-019831
Category (FI): G01N23/046,G01N23/04
Stage: Grant (IP right granted following substantive examination.)
Filing Date: Feb. 10, 2022
Publication Date: Aug. 23, 2023
The original document can be viewed at: https://www.j-platpat.inpit.go.jp/p0100
Disclaimer: Curated by HT Syndication....