Japan, June 10 -- HITACHI SOLUTIONS LTD has got intellectual property rights for 'X-RAY INSPECTION DEVICE AND X-RAY INSPECTION METHOD.' Other related details are as follows:
Application Number: JP,2023-038454
Category (FI): G01N23/10,G01N23/04,340
Stage: Grant (IP right granted following substantive examination.)
Filing Date: March 13, 2023
Publication Date: Sept. 27, 2024
The original document can be viewed at: https://www.j-platpat.inpit.go.jp/p0100
Disclaimer: Curated by HT Syndication....