Japan Intellectual Property Rights: TESTING DEVICE OF ELECTROLYTIC CELL, METHOD OF USING TESTING DEVICE OF ELECTROLYTIC CELL, AND EVALUATION METHOD OF ELECTROLYTIC CELL USING TESTING DEVICE OF ELECTROLYTIC CELL

Japan, Sept. 14 -- NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY has got intellectual property rights for 'TESTING DEVICE OF ELECTROLYTIC CELL, METHOD OF USING TESTING DEVICE OF ELECTROLYTIC CELL, AND EVALUATION METHOD OF ELECTROLYTIC CELL USING TESTING DEVICE OF ELECTROLYTIC CELL.' Other related details are as follows:

Application Number: JP,2023-052590

Category (FI): C25B1/042,C25B9/60,C25B9/00@A,C25B15/00,302@Z

Stage: Grant (IP right granted following substantive examination.)

Filing Date: March 29, 2023

Publication Date: Oct. 10, 2024

The original document can be viewed at: https://www.j-platpat.inpit.go.jp/p0100

Disclaimer: Curated by HT Syndication....