Japan, May 21 -- GUANGDONG HONGHAO SEMICONDUCTOR EQUIPMENT CO LTD has got intellectual property rights for 'SURFACE DEFECT DETECTION METHOD.' Other related details are as follows:

Application Number: JP,2025-034025

Category (FI): H01L21/66@J,H10P74/20@J,G06T1/00@C,G06N3/02

Stage: Grant (IP right granted following substantive examination.)

Filing Date: March 4, 2025

Publication Date: Dec. 5, 2025

The original document can be viewed at: https://www.j-platpat.inpit.go.jp/p0100

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