Japan, May 21 -- GUANGDONG HONGHAO SEMICONDUCTOR EQUIPMENT CO LTD has got intellectual property rights for 'SURFACE DEFECT DETECTION METHOD.' Other related details are as follows:
Application Number: JP,2025-034025
Category (FI): H01L21/66@J,H10P74/20@J,G06T1/00@C,G06N3/02
Stage: Grant (IP right granted following substantive examination.)
Filing Date: March 4, 2025
Publication Date: Dec. 5, 2025
The original document can be viewed at: https://www.j-platpat.inpit.go.jp/p0100
Disclaimer: Curated by HT Syndication....