Japan, July 27 -- KLA CORP has got intellectual property rights for 'SEMICONDUCTOR DEVICE DEFECT DETECTION APPARATUS AND METHOD.' Other related details are as follows:
Application Number: JP,2023-181884
Category (FI): G01N21/956@A
Stage: Grant (IP right granted following substantive examination.)
Filing Date: Oct. 23, 2023
Publication Date: Dec. 8, 2023
The original document can be viewed at: https://www.j-platpat.inpit.go.jp/p0100
Disclaimer: Curated by HT Syndication....