Japan, Sept. 30 -- HITACHI HIGH-TECH CORP has got intellectual property rights for 'SAMPLE STATE DETERMINATION DEVICE, SAMPLE STATE DETERMINATION METHOD AND SAMPLE INSPECTION DEVICE.' Other related details are as follows:
Application Number: JP,2022-101278
Category (FI): G06T7/12,G01N21/88@J,G01N35/02@C,G01N33/48@H,G06T7/00,612
Stage: Grant (IP right granted following substantive examination.)
Filing Date: June 23, 2022
Publication Date: Jan. 11, 2024
The original document can be viewed at: https://www.j-platpat.inpit.go.jp/p0100
Disclaimer: Curated by HT Syndication....