Japan, Oct. 27 -- HIOKI EE CORP has got intellectual property rights for 'RESISTANCE MEASURING DEVICE AND RESISTANCE MEASURING METHOD.' Other related details are as follows:
Application Number: JP,2022-165660
Category (FI): G01R27/02,G01R27/02@R
Stage: Grant (IP right granted following substantive examination.)
Filing Date: Oct. 14, 2022
Publication Date: April 25, 2024
The original document can be viewed at: https://www.j-platpat.inpit.go.jp/p0100
Disclaimer: Curated by HT Syndication....