Japan, July 6 -- FUJITSU GENERAL LTD has got intellectual property rights for 'METHOD FOR MEASURING THERMAL RESISTANCE OF SEMICONDUCTOR ELEMENT AND DEVICE FOR MEASURING THERMAL RESISTANCE OF SEMICONDUCTOR ELEMENT.' Other related details are as follows:
Application Number: JP,2022-060097
Category (FI): G01R31/26@B
Stage: Grant (IP right granted following substantive examination.)
Filing Date: March 31, 2022
Publication Date: Oct. 16, 2023
The original document can be viewed at: https://www.j-platpat.inpit.go.jp/p0100
Disclaimer: Curated by HT Syndication....