Japan, Sept. 3 -- ICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPRUEFTECHNIK MBH has got intellectual property rights for 'METHOD FOR INFLUENCING CHARGED PARTICLE BEAM, MULTIPOLE DEVICE, AND CHARGED PARTICLE BEAM APPARATUS.' Other related details are as follows:
Application Number: JP,2024-154018
Category (FI): H01J37/153@B,H01J37/147@B,H01J37/28@B
Stage: Grant (IP right granted following substantive examination.)
Filing Date: Sept. 6, 2024
Publication Date: Dec. 19, 2024
The original document can be viewed at: https://www.j-platpat.inpit.go.jp/p0100
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