Japan, March 27 -- XWINSYS TECHNOLOGY DEVELOPMENT LTD has got intellectual property rights for 'DUAL SOURCE X-RAY INSPECTION SYSTEM AND METHOD.' Other related details are as follows:
Application Number: JP,2024-159858
Category (FI): G01N23/223
Stage: Grant (IP right granted following substantive examination.)
Filing Date: Sept. 17, 2024
Publication Date: March 31, 2025
The original document can be viewed at: https://www.j-platpat.inpit.go.jp/p0100
Disclaimer: Curated by HT Syndication....