Intellectual Property India Publishes Patent Application for Wad-Yolo: Wavelet-Based Adaptive Defect Detection With Multi-Resolution Feature Analysis For Steel Surfaces

MUMBAI, India, Sept. 14 -- Intellectual Property India has published a patent application (202641107315 A) filed by Kkr & Ksr Institute Of Technology And Sciences on September 07, 2026, for Wad-Yolo: Wavelet-Based Adaptive Defect Detection With Multi-Resolution Feature Analysis For Steel Surfaces.

Inventors include Mr. Prof. Repudi Ramesh; Mrs. Dr. S. Sri Lakshmi Parvathi; A. Nagaraju; B. Chandra Sekhar; Ch. Moses Christopher; and B. Kotaiah.

The application for the patent was published on September 11, 2026, under issue no. 37/2026.

Abstract: ABSTRACT [0011] A wavelet-based adaptive defect detection framework designated WAD-YOLO is disclosed for accurate identification of steel surface defects. Discrete wavelet transform decomposes indu...