MUMBAI, India, July 31 -- Intellectual Property India has published a patent application (202617066018 A) filed by Sikora AG on May 25, 2026, for Terahertz Measuring Device And Method For Calibrating A Terahertz Measuring Device.
Inventors include Miesner, Sebastian; and Sikora, Harald.
The application for the patent was published on July 24, 2026, under issue no. 30/2026.
Abstract: The invention relates to a terahertz measuring device for measuring the wall thickness of an object, wherein the terahertz measuring device has a terahertz transmitter which can be rotated with a rotating ring or along a rotating ring about a measuring region which accommodates the object during measurement, and a terahertz receiver which can be rotated with ...