Intellectual Property India Publishes Patent Application for Systems And Methods For Thermal Characterization Of Materials At Nanoscale

MUMBAI, India, June 30 -- Intellectual Property India has published a patent application (202541059553 A) filed by Indian Institute Of Science on June 21, 2025, for Systems And Methods For Thermal Characterization Of Materials At Nanoscale.

Inventors include Ambarish Ghosh; Eklavy Vashist; and Brateen Pal.

The application for the patent was published on June 26, 2026, under issue no. 26/2026.

Abstract: ABSTRACT SYSTEMS AND METHODS FOR THERMAL CHARACTERIZATION OF MATERIALS AT NANOSCALE The present disclosure generally relates to nanotechnology and quantum sensing systems, and more particularly relates to a method and system for thermal characterization of a target material at nanoscale. The system 100 may include one or more quantum senso...