Intellectual Property India Publishes Patent Application for System For Statistical Quality Control Of A Manufacturing Process Using Validated Frozen Control Limits

MUMBAI, India, Oct. 26 -- Intellectual Property India has published a patent application (202641123768 A) filed by Vellore Institute Of Technology on October 15, 2026, for System For Statistical Quality Control Of A Manufacturing Process Using Validated Frozen Control Limits.

Inventors include Dr Meenakshi Sp; and Munal Singh.

The application for the patent was published on October 23, 2026, under issue no. 43/2026.

Abstract: ABSTRACT SYSTEM FOR STATISTICAL QUALITY CONTROL OF A MANUFACTURING PROCESS USING VALIDATED FROZEN CONTROL LIMITS A system (100) for statistical quality control of a manufacturing process comprises a processor (102), a time-series measurement store (130) storing measurements of a characteristic, and a control-chart a...