Intellectual Property India Publishes Patent Application for System For Detecting Externally Assisted Malpractice At A Monitored Assessment Station

MUMBAI, India, Oct. 26 -- Intellectual Property India has published a patent application (202641123783 A) filed by Vellore Institute Of Technology on October 15, 2026, for System For Detecting Externally Assisted Malpractice At A Monitored Assessment Station.

Inventors include Ramani S; and Aditya Sridhar.

The application for the patent was published on October 23, 2026, under issue no. 43/2026.

Abstract: ABSTRACT SYSTEM FOR DETECTING EXTERNALLY ASSISTED MALPRACTICE AT A MONITORED ASSESSMENT STATION An integrity-monitoring system includes a display panel (200) presenting assessment items to a candidate, an airborne acoustic transducer (402), an input-device interface (500) for an input device (505), and a processing unit (150). A photome...