MUMBAI, India, Sept. 22 -- Intellectual Property India has published a patent application (202641107549 A) filed by Shikha Vaidh on September 07, 2026, for System And Method For Measuring Knowledge Quality Using Original Thought Density In Human And Ai-Assisted Documents (otp™).
Inventor includes Shikha Vaidh.
The application for the patent was published on September 18, 2026, under issue no. 38/2026.
Abstract: A computer-implemented system and method evaluate knowledge quality in human-authored or AI-assisted content. A content object is ingested and segmented into knowledge units. Candidate original thoughts are detected and evaluated using observation strength, novelty, evidence and decision impact. Accepted original thoughts are scor...