MUMBAI, India, Sept. 28 -- Intellectual Property India has published a patent application (202641112212 A) filed by Gowtham S; Sam Johnston C; and Sam V George on September 18, 2026, for System And Method For Automated Defect Detection And Boundary Mapping In X-Ray Weld Images.
Inventor includes Sam V George.
The application for the patent was published on September 25, 2026, under issue no. 39/2026.
Abstract: This invention describes a computer-based deep learning system built to automatically detect and segment weld defects in industrial X-ray images. The system takes in one or more X-ray weld images and runs them through a two-stage pipeline: first a primary classification network, then an advanced, modified segmentation network. The ...