MUMBAI, India, Nov. 2 -- Intellectual Property India has published a patent application (202611116470 A) filed by Vivekananda Institute Of Professional Studies - Technical Campus on September 29, 2026, for System And Method For Analog-Domain Semiconductor Failure Prediction Using A Nonlinear Material Neural Network.
Inventors include Prof. Dr. Ravi Prakash Iyer; and Dr. Rajesh Yadav.
The application for the patent was published on October 30, 2026, under issue no. 44/2026.
Abstract: The invention relates to semiconductor health monitoring and predictive failure analysis for power, RF, and high-frequency semiconductor devices. A semiconductor device monitoring unit observes live physical observables including drain current variations, gat...