MUMBAI, India, July 7 -- Intellectual Property India has published a patent application (202647080989 A) filed by Mp, Inc. on July 01, 2026, for On-Machine Metrology For Manufacturing Machine.
Inventor includes Bauza, Marcin B..
The application for the patent was published on July 03, 2026, under issue no. 27/2026.
Abstract: A method includes receiving data associated with a workpiece mounted in a manufacturing machine. The method includes, following performance of a first machining operation on the workpiece by the manufacturing machine that generates a first feature on the workpiece, gathering a first data set. The method includes gathering a second data set. The method includes determining a difference data set based on differences be...