MUMBAI, India, Oct. 12 -- Intellectual Property India has published a patent application (202617087274 A) filed by Endresshauser Flowtec AG on July 16, 2026, for Method For Monitoring A Metrological Performance Of A Measuring Device.
Inventors include Rieder, Alfred; and Vaissiere, Dimitri.
The application for the patent was published on October 09, 2026, under issue no. 41/2026.
Abstract: With reference to figure 4, the method for monitoring a metrological performance of a measuring device (300), wherein the measuring device provides a series of successive measured values of a physical parameter, can be summarized as follows: The method comprises the following: obtaining an initial set of successive measured values in the series of succ...