MUMBAI, India, Aug. 31 -- Intellectual Property India has published a patent application (202641099609 A) filed by Dr. S. Senthamizh Selvi; Ms. R. Gayathiri; Ms. V. Radha; Ms. S. Deeparani; J. Lavanya; Ms. Nagamalini V.; Ms. Lavanya Jayaraman; and Ms. N. M. Sharmila on August 18, 2026, for Machine Vision Based Image And Video Analysis System For Industrial Defect Detection And Process Control.
Inventors include Dr. S. Senthamizh Selvi; Ms. R. Gayathiri; Ms. V. Radha; Ms. S. Deeparani; J. Lavanya; Ms. Nagamalini V.; Ms. Lavanya Jayaraman; and Ms. N. M. Sharmila.
The application for the patent was published on August 28, 2026, under issue no. 35/2026.
Abstract: The present invention relates to an image and video analysis system based on ma...