Intellectual Property India Publishes Patent Application for Intermittent Temperature Measurement System In A Microwave Chamber For Rapid Histopathology

MUMBAI, India, Sept. 28 -- Intellectual Property India has published a patent application (202641110719 A) filed by National Institute Of Technology Calicut, An Indian on September 15, 2026, for Intermittent Temperature Measurement System In A Microwave Chamber For Rapid Histopathology.

Inventors include Raghu Chandanakavu Variyam; and Alen James.

The application for the patent was published on September 25, 2026, under issue no. 39/2026.

Abstract: ABSTRACT INTERMITTENT TEMPERATURE MEASUREMENT SYSTEM IN A MICROWAVE CHAMBER FOR RAPID HISTOPATHOLOGY The present invention relates to a method and system for accurate temperature measurement inside a microwave chamber (2) using intermittent temperature measurement synchronized with microwave o...