MUMBAI, India, Oct. 26 -- Intellectual Property India has published a patent application (202641121089 A) filed by Rajalakshmi Engineering College Autonomous on October 09, 2026, for Inline Sludge Characterization And Automated Dual-Path Routing Using Moisture-Compensated X- Ray Fluorescence Analysis.
Inventor includes Dr. M. Thangamani.
The application for the patent was published on October 23, 2026, under issue no. 43/2026.
Abstract: Inline Sludge Characterization and Automated Dual-Path Routing Using Moisture- Compensated X-Ray Fluorescence Analysis ABSTRACT This specification describes an apparatus for continuous inline heavy metal analysis of wet dewatered sludge and automated routing to one of two processing paths. A sludge condit...